Skip all navigation and jump to content Jump to site navigation Jump to section navigation.
NASA Logo - National Aeronautics SPace Administration
Electron & Optical Device Branch
BIOGRAPHIES FACILITIES GENERAL CAPABILITY CURRENT PROJECTS CONTACT US

Publications for Amy R. Asmus

 
Publications
 
Sommerich, C.M., Lavender, S.A., Asmus, A., Chany, A-M., Parakkat, J., Yang, G. (December 2005). Ergonomic issues in the cake decorating process. In W. Karwowski and W.S. Marras (eds), The Industrial Ergonomics Handbook, 2nd ed. CRC Press, Boca Raton.
 
Sommerich, C.M., Vatan, S., and Asmus, A. (2004). Computer input devices: quantification of use and variation in use, in Proceedings of the Human Factors and Ergonomics Society 48th Annual Meeting, Human Factors and Ergonomics Society, New Orleans, LA.
 
Page 1 of 1
BIOGRAPHIES BIOGRAPHIES BIOGRAPHIES FACILITIES FACILITIES FACILITIES GENERAL CAPABILITY GENERAL CAPABILITY GENERAL CAPABILITY CURRENT PROJECTS CURRENT PROJECTS CURRENT PROJECTS CONTACT US CONTACT US CONTACT US Biographies Facilities General Capability Current Projects Contact Us SAMUEL A. ALTEROVITZ SAMUEL A. ALTEROVITZ SAMUEL A. ALTEROVITZ AMY R. ASMUS AMY R. ASMUS AMY R. ASMUS ALAN N. DOWNEY ALAN N. DOWNEY ALAN N. DOWNEY DALE A. FORCE DALE A. FORCE DALE A. FORCE JON C. FREEMAN JON C. FREEMAN JON C. FREEMAN JENNIFER L. JORDAN JENNIFER L. JORDAN JENNIFER L. JORDAN ISAY L. KRAINSKY ISAY L. KRAINSKY ISAY L. KRAINSKY GEORGE E. PONCHAK GEORGE E. PONCHAK GEORGE E. PONCHAK MAX C. SCARDELLETTI MAX C. SCARDELLETTI MAX C. SCARDELLETTI RAINEE N. SIMONS RAINEE N. SIMONS RAINEE N. SIMONS JOSEPH D. WARNER JOSEPH D. WARNER JOSEPH D. WARNER JEFFREY D. WILSON JEFFREY D. WILSON JEFFREY D. WILSON EDWIN G. WINTUCKY EDWIN G. WINTUCKY EDWIN G. WINTUCKY KARL R. VADEN KARL R. VADEN KARL R. VADEN -CONTRACTORS- -CONTRACTORS- -CONTRACTORS- CHRISTINE T. CHEVALIER CHRISTINE T. CHEVALIER CHRISTINE T. CHEVALIER CAROL L. KORY CAROL L. KORY CAROL L. KORY ELECTRON EMISSION ELECTRON EMISSION ELECTRON EMISSION ELECTRONIC FABRICATION ELECTRONIC FABRICATION ELECTRONIC FABRICATION MICROWAVE VACUUM TEST MICROWAVE VACUUM TEST MICROWAVE VACUUM TEST RF MICROWAVE METROLOGY RF MICROWAVE METROLOGY RF MICROWAVE METROLOGY THIN FILM OPTICAL THIN FILM OPTICAL THIN FILM OPTICAL NOT PROVIDED NOT PROVIDED NOT PROVIDED METAMATERIAL LENS METAMATERIAL LENS METAMATERIAL LENS ANGULAR DISTRIBUTION ANGULAR DISTRIBUTION ANGULAR DISTRIBUTION SLOW-WAVE CIRCUITS SLOW-WAVE CIRCUITS SLOW-WAVE CIRCUITS CARBON NANOTUBE CARBON NANOTUBE CARBON NANOTUBE HIGH TEMP. ELECTRONICS HIGH TEMP. ELECTRONICS HIGH TEMP. ELECTRONICS SILICON GERMANIUM  SILICON GERMANIUM  SILICON GERMANIUM  NOT PROVIDED NOT PROVIDED NOT PROVIDED